Difference between revisions of "VLSI Reading Group"
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* Ketan N. Patel, Igor L. Markov and John P. Hayes. [http://citeseer.ist.psu.edu/644440.html Evaluating Circuit Reliability Under Probabilistic Gate-Level Fault Models], IWLS 2003. | * Ketan N. Patel, Igor L. Markov and John P. Hayes. [http://citeseer.ist.psu.edu/644440.html Evaluating Circuit Reliability Under Probabilistic Gate-Level Fault Models], IWLS 2003. | ||
| + | * F. Wang, X. Wu and Y. Xie, [http://bacon.cse.ucsc.edu/papers/aspdac_2008/p2_1A-1.pdf Variability-Driven Module Selection with Joint Design Time Optimization and Post-Silicon Tuning], ASPDAC 2008. | ||
* A. B. Kahng, P. Sharma, and A. Zelikovsky, "[http://portal.acm.org/citation.cfm?id=1233639 Fill for Shallow Trench Isolation CMP]", Proc. ACM/IEEE Intl. Conf. on Computer-Aided Design, November 2006, pp. 661-668. | * A. B. Kahng, P. Sharma, and A. Zelikovsky, "[http://portal.acm.org/citation.cfm?id=1233639 Fill for Shallow Trench Isolation CMP]", Proc. ACM/IEEE Intl. Conf. on Computer-Aided Design, November 2006, pp. 661-668. | ||
Revision as of 03:04, 23 January 2008
Overview
The reading group will meet in E2-209 every Thursday for approximately 1 hour (12:15-1:15). Students will be selected to present an informal discussion of a chosen paper. Credit for the seminar is given based on your participation. You are welcome to bring your lunch.
Participants
- Matthew Guthaus
- Rigo Dicochea
- Sheldon Logan
- Keven Woo
- Mohammed Jamil
- J. Semendari
- Yaron Kretchmer
Schedule
| Date | Presenter | Paper |
|---|---|---|
| 1/10/08 | - | NOT MEETING |
| 1/17/08 | Matt | M.R. Guthaus, D. Sylvester, R.B. Brown. Clock Tree Synthesis with Data-path Sensitivity Matching, ASPDAC, Seoul, Korea, 2008, IN PRESS. |
| 1/24/08 | - | NOT MEETING |
| 1/31/08 | Yaron | Boyd, S. P. and Kim, S. J. Geometric programming for circuit optimization, In Proceedings of the 2005
international Symposium on Physical Design (San Francisco, California, USA, April 03 - 06, 2005). ISPD '05. ACM, New York, NY, 44-46. |
| 1/31/08 | Rigo | TBD |
| 2/7/08 | Sheldon | TBD |
| 2/7/08 | Keven | K.-C. Wu and D. Marculescu, Soft Error Rate Reduction Using Redundancy Addition and Removal , ASPDAC 2008. |
| 2/14/08 | Jeff | TBD |
| 2/14/08 | Linh | TBD |
| 2/21/08 | TBD | TBD |
| 2/21/08 | TBD | TBD |
| 2/28/08 | TBD | TBD |
| 2/28/08 | TBD | TBD |
| 3/6/08 | TBD | TBD |
| 3/6/08 | TBD | TBD |
| 3/13/08 | TBD | TBD |
| 3/13/08 | TBD | TBD |
Potential Papers
- Ketan N. Patel, Igor L. Markov and John P. Hayes. Evaluating Circuit Reliability Under Probabilistic Gate-Level Fault Models, IWLS 2003.
- F. Wang, X. Wu and Y. Xie, Variability-Driven Module Selection with Joint Design Time Optimization and Post-Silicon Tuning, ASPDAC 2008.
- A. B. Kahng, P. Sharma, and A. Zelikovsky, "Fill for Shallow Trench Isolation CMP", Proc. ACM/IEEE Intl. Conf. on Computer-Aided Design, November 2006, pp. 661-668.
- S., Srivastava, A., Sharma, D., Sylvester, D., Blaauw, D., and Zolotov, V. 2005. Discrete Vt assignment and gate sizing using a self-snapping continuous formulation. In Proceedings of the 2005 IEEE/ACM international Conference on Computer-Aided Design (San Jose, CA, November 06 - 10, 2005). International Conference on Computer Aided Design. IEEE Computer Society, Washington, DC, 705-712.
- Cong, J., Shinnerl, J. R., Xie, M., Kong, T., and Yuan, X. 2005. Large-scale circuit placement. ACM Trans. Des. Autom. Electron. Syst. 10, 2 (Apr. 2005), 389-430.
- Other papers from ICCAD 2007.
