Difference between revisions of "VLSI Reading Group"

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(Spring 2008)
(Spring 2008)
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| 4/21/08
 
| 4/21/08
 
| Matt
 
| Matt
| Satisfiability
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| Satisfiability (No Paper)
 
|-
 
|-
 
| 4/21/08
 
| 4/21/08

Revision as of 16:51, 7 April 2008

Overview

The reading group will meet in E2-209 once a week for approximately 1 hour. Students will be selected to present an informal discussion of a chosen paper. Credit for the seminar is given based on your participation. You are welcome to bring your lunch.

Participants

Spring 2008

Date Presenter Paper
4/7/08 Rigo S. N. Adya and I. L. Markov, "Fixed-outline Floorplanning Through Better Local Search" Int'l Conf. On Computer Design (ICCD 2001), pp.328-333.
4/7/08 Sheldon Rao, R. M., Liu, F., Burns, J. L., and Brown, R. B. A Heuristic to Determine Low Leakage Sleep State Vectors for CMOS Combinational Circuits. ICCAD, 2003, pp 689-697
4/14/08 No class (@ ISPD)
4/21/08 Matt Satisfiability (No Paper)
4/21/08  ? TBD
4/28/08  ? TBD
4/28/08  ? TBD
5/5/08 Nobody Out of Town
5/12/08  ? TBD
5/12/08  ? TBD
5/19/08  ? TBD
5/19/08  ? TBD
5/26/08 Nobody No class (Memorial Day)
6/2/08  ? TBD
6/2/08  ? TBD

Potential Papers

  • Cong, J., Shinnerl, J. R., Xie, M., Kong, T., and Yuan, X. 2005. Large-scale circuit placement. ACM Trans. Des. Autom. Electron. Syst. 10, 2 (Apr. 2005), 389-430.


Old Schedules

Winter 2008

Date Presenter Paper
1/10/08 - NOT MEETING
1/17/08 Matt M.R. Guthaus, D. Sylvester, R.B. Brown. Clock Tree Synthesis with Data-path Sensitivity Matching, ASPDAC, Seoul, Korea, 2008, IN PRESS.
1/24/08 - NOT MEETING
1/31/08 Yaron Boyd, S. P. and Kim, S. J. Geometric programming for circuit optimization, In Proceedings of the 2005 international Symposium on Physical Design (San Francisco, California, USA, April 03 - 06, 2005). ISPD '05. ACM, New York, NY, 44-46.
1/31/08 Rigo F. Wang, X. Wu and Y. Xie, Variability-Driven Module Selection with Joint Design Time Optimization and Post-Silicon Tuning, ASPDAC 2008.
2/07/08 - NOT MEETING
2/14/08 Sheldon Ketan N. Patel, Igor L. Markov and John P. Hayes. Evaluating Circuit Reliability Under Probabilistic Gate-Level Fault Models, IWLS 2003.
2/14/08 Keven K.-C. Wu and D. Marculescu, Soft Error Rate Reduction Using Redundancy Addition and Removal , ASPDAC 2008.
2/21/08 Jeff Liang, X., Turgay, K., and Brooks, D. Architectural power models for SRAM and CAM structures based on hybrid analytical/empirical techniques. ICCAD, 2007, pp 824-830.
2/21/08 Jeff Cacti
2/28/08 Mohammed Wei Huang; Ghosh, S.; Velusamy, S.; Sankaranarayanan, K.; Skadron, K.; Stan, M.R., "HotSpot: a compact thermal modeling methodology for early-stage VLSI design," Very Large Scale Integration (VLSI) Systems, IEEE Transactions on , vol.14, no.5, pp. 501-513, May 2006.
2/28/08 Linh Xin Li, Taylor, Brian YuTsun Chien, Pileggi, Lawrence T. Adaptive post-silicon tuning for analog circuits: concept, analysis and optimization. ICCAD 2007, pp 450-457.
3/6/08 NO MEETING
3/13/08 Janak H. Patel (UIUC) CMOS Process Variations: A "Critical Operation Point" hypothesis