Difference between revisions of "280G F09"
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| Lide Zhang, Robert P. Dick, [http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4796528 Scheduled voltage scaling for increasing lifetime in the presence of NBTI], ASP-DAC 2009 | | Lide Zhang, Robert P. Dick, [http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4796528 Scheduled voltage scaling for increasing lifetime in the presence of NBTI], ASP-DAC 2009 | ||
Yu Wang et al, [http://www.date-conference.com/archive/conference/proceedings/PAPERS/2009/DATE09/PDFFILES/04.2_1.PDF Gate Replacement Techniques for Simultaneous Leakage and Aging Optimization], DATE2009 | Yu Wang et al, [http://www.date-conference.com/archive/conference/proceedings/PAPERS/2009/DATE09/PDFFILES/04.2_1.PDF Gate Replacement Techniques for Simultaneous Leakage and Aging Optimization], DATE2009 | ||
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| 10/13/09 | | 10/13/09 | ||
Revision as of 22:58, 29 September 2009
- Each week, one person will present TWO papers. Everyone only presents one day.
- You must select papers that are from 2009 in top conferences.
- You must think that the papers are VERY GOOD. To do this, you need to read the paper BEFORE you select it for the group. You may need to read several papers to find a good one.
- You must post your papers one week prior to your presentation.
Winter 2009
| Date | Presenter | Paper |
|---|---|---|
| 9/29/09 | Sheldon Logan(VLSI-SOC practice) | |
| 10/6/09 | Seokjoong Kim | Lide Zhang, Robert P. Dick, Scheduled voltage scaling for increasing lifetime in the presence of NBTI, ASP-DAC 2009
Yu Wang et al, Gate Replacement Techniques for Simultaneous Leakage and Aging Optimization, DATE2009 |
| 10/13/09 | No 280G (VLSI-SOC conference) | |
| 10/20/09 | Keven L. Woo | |
| 10/27/09 | ||
| 11/03/09 | Sheldon Logan | |
| 11/10/09 | Xuchu Hu | |
| 11/17/09 | Andrew W. Hill | |
| 11/24/09 | ||
| 12/1/09 | ||
| 12/8/09 |
