Difference between revisions of "280G F09"

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(Winter 2009)
(Winter 2009)
Line 17: Line 17:
 
| 10/6/09
 
| 10/6/09
 
| Seokjoong Kim
 
| Seokjoong Kim
| 1. Lide Zhang, Robert P. Dick, [http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4796528 Scheduled voltage scaling for increasing lifetime in the presence of NBTI], ASP-DAC 2009, 2. Yu Wang et al, [http://www.date-conference.com/archive/conference/proceedings/PAPERS/2009/DATE09/PDFFILES/04.2_1.PDF Gate Replacement Techniques for Simultaneous Leakage and Aging Optimization], DATE2009
+
| 1. Lide Zhang, Robert P. Dick, [http://portal.acm.org/ft_gateway.cfm?id=1509750&type=pdf&coll=GUIDE&dl=GUIDE&CFID=54152666&CFTOKEN=66311239 Scheduled voltage scaling for increasing lifetime in the presence of NBTI], ASP-DAC 2009, 2. Yu Wang et al, [http://www.date-conference.com/archive/conference/proceedings/PAPERS/2009/DATE09/PDFFILES/04.2_1.PDF Gate Replacement Techniques for Simultaneous Leakage and Aging Optimization], DATE2009
 
|-
 
|-
 
| 10/13/09
 
| 10/13/09

Revision as of 00:30, 30 September 2009

  • Each week, one person will present TWO papers. Everyone only presents one day.
  • You must select papers that are from 2009 in top conferences.
  • You must think that the papers are VERY GOOD. To do this, you need to read the paper BEFORE you select it for the group. You may need to read several papers to find a good one.
  • You must post your papers one week prior to your presentation.

Winter 2009

Date Presenter Paper
9/29/09 Sheldon Logan(VLSI-SOC practice)
10/6/09 Seokjoong Kim 1. Lide Zhang, Robert P. Dick, Scheduled voltage scaling for increasing lifetime in the presence of NBTI, ASP-DAC 2009, 2. Yu Wang et al, Gate Replacement Techniques for Simultaneous Leakage and Aging Optimization, DATE2009
10/13/09 No 280G (VLSI-SOC conference)
10/20/09 Keven L. Woo
10/27/09
11/03/09 Sheldon Logan
11/10/09 Xuchu Hu
11/17/09 Andrew W. Hill
11/24/09
12/1/09
12/8/09