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| __NOTOC__ | | __NOTOC__ |
| ==Overview== | | ==Overview== |
− | The reading group will meet in E2-209 on Tuesdays 3-4pm. Students will be selected to present an informal discussion of a chosen paper. Credit (pass/fail only) for the seminar is given based on your participation. | + | The reading group will weekly. Students will be selected to present an informal discussion of a chosen paper. Credit (pass/fail only) for the seminar is given based on your participation. |
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− | ==Participants== | + | ==Current Schedule== |
− | * [http://www.soe.ucsc.edu/~mrg Matthew Guthaus]
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− | * [http://www.soe.ucsc.edu/~slogan Sheldon Logan]
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− | * Jeren Semendari
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− | * [http://www.soe.ucsc.edu/~kwoo Keven Woo]
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− | * Derek C
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− | * [http://www.soe.ucsc.edu/~seokjkim Seokjoong Kim]
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− | * [http://www.soe.ucsc.edu/~xhu Xuchu Hu]
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− | ==Fall 2008==
| + | * [[280G W15]] |
− | {| border="1"
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− | ! Date
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− | ! Presenter
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− | ! Paper
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− | | 9/30/08
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− | | Jeff
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− | | Jaydeep P. Kulkarni (Purdue Univ.), Keejong Kim (Broadcom Inc.), Sang Phill Prak (Purdue Univ.), Kaushik Roy (Purdue Univ.), [http://bacon.cse.ucsc.edu/papers/DAC2008/data/papers/2008/07.6_Paper.pdf#page=1 Process Variation Tolerant SRAM Array for Ultra Low Voltage Applications], DAC2008.
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− | | 9/30/08
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− | | 10/7/08
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− | | 10/7/08
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− | | 10/14/08
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− | | 10/14/08
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− | | 10/21/08
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− | | 10/21/08
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− | | 10/28/08
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− | | 10/28/08
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− | | 11/04/08
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− | | 11/04/08
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− | | 11/11/08
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− | | Veteran's Day (No Class)
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− | | 11/18/08
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− | | 11/18/08
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− | | 11/25/08
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− | | 11/25/08
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− | | 12/02/08
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− | | 12/02/08
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− | |}
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− | == Potential Papers== | + | ==Past Schedules== |
− | | + | * [[280G F14]] |
− | * Focus primarily on [http://bacon.cse.ucsc.edu/papers/DAC2008/start.htm DAC 2008] | + | * [[280G W13]] |
− | | + | * [[280G F12]] |
− | == Old Schedules ==
| + | * [[280G S12]] |
− | ===Spring 2008===
| + | * [[280G F11]] |
− | {| border="1"
| + | * [[280G S11]] |
− | |-
| + | * [[280G W11]] |
− | ! Date
| + | * [[280G F10]] |
− | ! Presenter
| + | * [[280G S10]] |
− | ! Paper
| + | * [[280G W10]] |
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| + | * [[280G F09]] |
− | | 4/7/08
| + | * [[280G W09]] |
− | | Rigo
| + | * [[280G F08]] |
− | | S. N. Adya and I. L. Markov, "[http://vlsicad.eecs.umich.edu/BK/parquet/iccd_2001_floorplan.pdf Fixed-outline Floorplanning Through Better Local Search]" Int'l Conf. On Computer Design (ICCD 2001), pp.328-333.
| + | * [[280G S08]] |
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| + | * [[280G W08]] |
− | | 4/7/08
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− | | Sheldon
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− | | Rao, R. M., Liu, F., Burns, J. L., and Brown, R. B. [http://ieeexplore.ieee.org/Xplore/login.jsp?url=/iel5/8895/28127/01257884.pdf?isnumber=28127&prod=CNF&arnumber=1257884&arSt=+689&ared=+692&arAuthor=Rao%2C+R.M.%3B+Liu%2C+F.%3B+Burns%2C+J.L.%3B+Brown%2C+R.B. A Heuristic to Determine Low Leakage Sleep State Vectors for CMOS Combinational Circuits]. ICCAD, 2003, pp 689-697
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− | | 4/14/08
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− | | No class (@ ISPD)
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− | | 4/21/08
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− | | Matt
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− | | Satisfiability (No Paper)
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− | | 4/28/08
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− | | Derek
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− | | Verilog-A & Current Work
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− | | 5/5/08
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− | | -
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− | | Out of Town
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− | | 5/12/08
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− | | Jeff
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− | | B. Mohammad, M. Saint-Laurent, P. Bassett, and J. Abraham. [http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4479707 Cache Design for Low Power and High Yield]. ISQED, 2008, pp 103-107.
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− | | 5/19/08
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− | | Keven
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− | | J. Sheaeffer D. Luebke K. Skadron [http://www.cs.virginia.edu/~skadron/Papers/sheaffer_gh2007.pdf A Hardware Redundancy and Recovery Mechanism for Reliable Scientific Computation on Graphics Processors]. ACM, 2007
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− | | 5/26/08
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− | | Nobody
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− | | No class (Memorial Day)
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− | | 6/2/08
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− | | -
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− | | No Class
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− | | 6/9/08
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− | | -
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− | | No Class (@ DAC)
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− | |}
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− | === Winter 2008 ===
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− | {| border="1"
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− | ! Date
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− | ! Presenter
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− | ! Paper
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− | | 1/10/08
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− | | -
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− | | NOT MEETING
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− | | 1/17/08
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− | | Matt
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− | | M.R. Guthaus, D. Sylvester, R.B. Brown. [http://bacon.cse.ucsc.edu/papers/guthaus-aspdac08.pdf Clock Tree Synthesis with Data-path Sensitivity Matching], ASPDAC, Seoul, Korea, 2008, IN PRESS.
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− | | 1/24/08
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− | | NOT MEETING
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− | | 1/31/08
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− | | Yaron
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− | | Boyd, S. P. and Kim, S. J. [http://portal.acm.org/citation.cfm?id=1055148 Geometric programming for circuit optimization], In Proceedings of the 2005 international Symposium on Physical Design (San Francisco, California, USA, April 03 - 06, 2005). ISPD '05. ACM, New York, NY, 44-46.
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− | | 1/31/08
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− | | Rigo
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− | | F. Wang, X. Wu and Y. Xie, [http://bacon.cse.ucsc.edu/papers/aspdac_2008/p2_1A-1.pdf Variability-Driven Module Selection with Joint Design Time Optimization and Post-Silicon Tuning], ASPDAC 2008.
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− | | 2/07/08
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− | | NOT MEETING
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− | | 2/14/08
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− | | Sheldon
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− | | Ketan N. Patel, Igor L. Markov and John P. Hayes. [http://citeseer.ist.psu.edu/644440.html Evaluating Circuit Reliability Under Probabilistic Gate-Level Fault Models], IWLS 2003.
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− | | 2/14/08
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− | | Keven
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− | | K.-C. Wu and D. Marculescu, [http://bacon.cse.ucsc.edu/papers/aspdac_2008/p559_7A-1.pdf Soft Error Rate Reduction Using Redundancy Addition and Removal ], ASPDAC 2008.
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− | | 2/21/08
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− | | Jeff
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− | | Liang, X., Turgay, K., and Brooks, D. [http://portal.acm.org/citation.cfm?id=1326073.1326245&coll=&dl=GUIDE&type=series&idx=SERIES388&part=series&WantType=Proceedings&title=ICCAD# Architectural power models for SRAM and CAM structures based on hybrid analytical/empirical techniques]. ICCAD, 2007, pp 824-830.
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− | | 2/21/08
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− | | Jeff
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− | | [http://www.ece.ubc.ca/~stevew/papers/html/jssc96/paper.html Cacti]
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− | | 2/28/08
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− | | Mohammed
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− | | Wei Huang; Ghosh, S.; Velusamy, S.; Sankaranarayanan, K.; Skadron, K.; Stan, M.R., "[http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1650228 HotSpot: a compact thermal modeling methodology for early-stage VLSI design]," Very Large Scale Integration (VLSI) Systems, IEEE Transactions on , vol.14, no.5, pp. 501-513, May 2006.
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− | | 2/28/08
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− | | Linh
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− | | Xin Li, Taylor, Brian YuTsun Chien, Pileggi, Lawrence T. [http://www.ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4397223&arnumber=4397306&count=153&index=82 Adaptive post-silicon tuning for analog circuits: concept, analysis and optimization.] ICCAD 2007, pp 450-457.
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− | | 3/6/08
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− | | NO MEETING
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− | | 3/13/08
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− | | Janak H. Patel (UIUC)
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− | | CMOS Process Variations: A "Critical Operation Point" hypothesis
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− | |-
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− | |}
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The reading group will weekly. Students will be selected to present an informal discussion of a chosen paper. Credit (pass/fail only) for the seminar is given based on your participation.