Difference between revisions of "VLSI Reading Group"

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__NOTOC__
 
==Overview==
 
==Overview==
The reading group will meet in E2-209 every Thursday for approximately 1 hour (12:15-1:15). Students will be selected to present an informal discussion of a chosen paper. Credit for the seminar is given based on your participation. You are welcome to bring your lunch.
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The reading group will weekly. Students will be selected to present an informal discussion of a chosen paper. Credit (pass/fail only) for the seminar is given based on your participation.
  
==Participants==
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==Current Schedule==
* [http://www.soe.ucsc.edu/~mrg Matthew Guthaus]
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* [http://www.soe.ucsc.edu/~rigo Rigo Dicochea]
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* Sheldon Logan
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* Keven Woo
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* Mohammed Jamil
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* J. Semendari
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* Yaron Kretchmer
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==Schedule==
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* [[280G W15]]
{| border="1"
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|-
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! Date
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! Presenter
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! Paper
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|-
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| 1/10/08
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| -
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| NOT MEETING
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|-
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| 1/17/08
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| Matt
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| M.R. Guthaus, D. Sylvester, R.B. Brown. [http://bacon.cse.ucsc.edu/papers/guthaus-aspdac08.pdf Clock Tree Synthesis with Data-path Sensitivity Matching], ASPDAC, Seoul, Korea, 2008, IN PRESS.
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|-
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| 1/24/08
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| -
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| NOT MEETING
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|-
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| 1/31/08
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| Yaron
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| Boyd, S. P. and Kim, S. J. [http://portal.acm.org/citation.cfm?id=1055148  Geometric programming for circuit optimization], In Proceedings of the 2005
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international Symposium on Physical Design (San Francisco, California, USA, April 03 - 06, 2005). ISPD '05. ACM, New York, NY, 44-46.
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|-
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==Past Schedules==
| 1/31/08
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* [[280G F14]]
| Rigo
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* [[280G W13]]
| F. Wang, X. Wu and Y. Xie, [http://bacon.cse.ucsc.edu/papers/aspdac_2008/p2_1A-1.pdf Variability-Driven Module Selection with Joint Design Time Optimization and Post-Silicon Tuning], ASPDAC 2008.
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* [[280G F12]]
|-
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* [[280G S12]]
| 2/7/08
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* [[280G F11]]
| Sheldon
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* [[280G S11]]
| TBD
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* [[280G W11]]
|-
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* [[280G F10]]
| 2/7/08
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* [[280G S10]]
| Keven
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* [[280G W10]]
| K.-C. Wu and D. Marculescu, [http://bacon.cse.ucsc.edu/papers/aspdac_2008/p559_7A-1.pdf Soft Error Rate Reduction Using Redundancy Addition and Removal ], ASPDAC 2008.
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* [[280G F09]]
|-
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* [[280G W09]]
| 2/14/08
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* [[280G F08]]
| Jeff
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* [[280G S08]]
| TBD
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* [[280G W08]]
|-
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| 2/14/08
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| Linh
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| TBD
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|-
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| 2/21/08
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| TBD
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| TBD
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|-
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| 2/21/08
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| TBD
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| TBD
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|-
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| 2/28/08
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| TBD
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| TBD
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|-
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| 2/28/08
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| TBD
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| TBD
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|-
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| 3/6/08
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| TBD
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| TBD
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|-
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| 3/6/08
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| TBD
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| TBD
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|-
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| 3/13/08
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| TBD
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| TBD
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|-
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| 3/13/08
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| TBD
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| TBD
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|-
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|}
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==Potential Papers==
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* Ketan N. Patel, Igor L. Markov and John P. Hayes. [http://citeseer.ist.psu.edu/644440.html Evaluating Circuit Reliability Under Probabilistic Gate-Level Fault Models],  IWLS 2003.
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* A. B. Kahng, P. Sharma, and A. Zelikovsky, "[http://portal.acm.org/citation.cfm?id=1233639 Fill for Shallow Trench Isolation CMP]", Proc. ACM/IEEE Intl. Conf. on Computer-Aided Design, November 2006, pp. 661-668.
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* S., Srivastava, A., Sharma, D., Sylvester, D., Blaauw, D., and Zolotov, V. 2005. [http://portal.acm.org/citation.cfm?id=1129702&jmp=cit&coll=portal&dl=ACM&CFID=7564954&CFTOKEN=49489343 Discrete Vt assignment and gate sizing using a self-snapping continuous formulation]. In Proceedings of the 2005 IEEE/ACM international Conference on Computer-Aided Design (San Jose, CA, November 06 - 10, 2005). International Conference on Computer Aided Design. IEEE Computer Society, Washington, DC, 705-712.
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* Cong, J., Shinnerl, J. R., Xie, M., Kong, T., and Yuan, X. 2005. [http://portal.acm.org/citation.cfm?id=1059886 Large-scale circuit placement]. ACM Trans. Des. Autom. Electron. Syst. 10, 2 (Apr. 2005), 389-430.
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* Other papers from [http://bacon.cse.ucsc.edu/papers ICCAD 2007].
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Latest revision as of 16:45, 5 January 2015

Overview

The reading group will weekly. Students will be selected to present an informal discussion of a chosen paper. Credit (pass/fail only) for the seminar is given based on your participation.

Current Schedule

Past Schedules